BOEDER 65756 DRIVER DETAILS:

Type: Driver
File Name: boeder_65756_20304.zip
File Size: 14.8 MB
Rating:
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8 (3.26)
Downloads: 2
Supported systems: Windows XP/Vista/7/8/10, MacOS 10/X
Price: Free* (*Free Registration Required)

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BOEDER 65756 DRIVER



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Multiple-bit upset cross sections are compared to single-event upset cross sections, and trends associated with scaling effects are presented. Show more. First Page of the Article. Duzellier, D. Falgubre, R. Ecoffet, I. Using a carbon beam as a probe to Boeder 65756 the thickness of sensitive volumes. The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume Sv of thickness d.

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Cheynet R. Valazco R. Ecoffet J. The microelectronics and photonics Boeder 65756 MPTB carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November Estimation of upset sensitive volume thickness and critical Boeder 65756 using low energy heavy-ion beams. Low energy, low range ions are used for creating various conditions for energy deposition in structures responsible for SEU effects.

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